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High-resolution x-ray-diffraction spectra of Thue-Morse GaAs-AlAs heterostructures: Towards a novel description of disorder
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Citations
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References
1991
Year
Ii-vi SemiconductorEngineeringPhysicsEssential PropertiesTopological HeterostructuresApplied PhysicsQuantum MaterialsCondensed Matter PhysicsSuperconductivityDisordered Quantum SystemSingular Continuous MeasuresMultilayer HeterostructuresCategoryiii-v SemiconductorNovel DescriptionOptoelectronicsCompound SemiconductorHigh-resolution X-ray-diffraction SpectraThue-morse Gaas-alas Heterostructures
We present the first analysis of high-resolution x-ray-diffraction spectra of finite-size Thue-Morse GaAs-AlAs superlattice heterostructures, which show essential properties of singular continuous measures. The implications for future investigations of disordered systems are considered.
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