(305) SrTiO3 as substrate for coherently tilted epitaxial YBa2Cu3O<i>x</i> thin films

Abstract

High Tc superconducting YBa2Cu3Ox (YBCO) thin films have been prepared on (305) SrTiO3 (STO) substrates. X-ray diffraction analysis and Rutherford backscattering experiments reveal that the c-axis of the layers is directed along the [001] STO axis. Bragg reflection measurements from YBCO lattice planes with high h, k, and l indices confirm that the film growth is epitaxial and almost single domain. For the critical current density jc(77 K) values of 2×106 and 1×103 A/cm2 have been found in the [010] and [501̄] YBCO directions, respectively.