T W Ryan

X-ray scattering studies of thin films and surfaces: thermal oxides on silicon

R. A. Cowley, T W Ryan · Journal of Physics D Applied Physics · 1987 · 121 citations

Natural Sciences, Materials Engineering, Materials Science +17

Characterization of nanometer-scale epitaxial structures by grazing-incidence x-ray diffraction and specular reflectivity

C. A. Lucas, P. D. Hatton, S. Bates et al. · Journal of Applied Physics · 1988 · 65 citations · Full text

Natural Sciences, Materials Science, Physics +17

The structure of the glass phase of Rb1?x(ND4)xD2PO4

R. A. Cowley, T W Ryan, E. Courtens · The European Physical Journal B · 1986 · 51 citations

Natural Sciences, Materials Science, Physics +11

Structural ordering below T_cin KDP and DKDP

R. J. Nelmes, W. F. Kuhs, C. J. Howard et al. · Journal of Physics C Solid State Physics · 1985 · 41 citations

Natural Sciences, Chemistry, Physics +14

Critical fluctuations in RbCaF₃. I. A high-resolution X-ray scattering study

A. Gibaud, T W Ryan, R. J. Nelmes · Journal of Physics C Solid State Physics · 1987 · 31 citations

Natural Sciences, Materials Science, Physics +17