Characterization of anodic sulfide films on Hg0.78Cd0.22Te

Abstract

Anodic sulfide films were grown on HgCdTe and studied by Auger electron spectroscopy, surface analysis by laser ionization, Rutherford backscattering spectroscopy, Raman and photoluminescence spectroscopy, and high-resolution transmission electron microscopy to determine their elemental composition and their chemical and physical structure. This information, when coupled with a knowledge of the possible chemical reactions at the interface between the film and the HgCdTe substrate, explains why anodic surface films are more thermally stable than anodic oxide films.