Investigations of thin films on GaAs using the proton resonant scattering technique

Range and stopping-power tables for heavy ions

L. C. Northcliffe, Roland Schilling · Atomic Data and Nuclear Data Tables · 1970 · 2.7K citations

Natural Sciences, Nuclear Engineering, Physics +13

Proton elastic scattering cross sections of carbon, nitrogen and silicon for backscattering analysis in the energy range 0.7—2.5 MeV

E. Raühala · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1985 · 116 citations

Natural Sciences, Materials Science, Physics +12

Characterization of WSi<i>x</i>/GaAs Schottky contacts

T. Ohnishi, N. Yokoyama, Hidetoshi Onodera et al. · Applied Physics Letters · 1983 · 79 citations

Engineering, Electrical Engineering, Materials Science +17

Oxygen detection by non-Rutherford proton backscattering below 2.5 MeV

M. Luomajärvi, E. Raühala, M. Hautala · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1985 · 60 citations

Natural Sciences, Physics, Nuclear Physics +2

Characteristics of WN/GaAs Schottky Contacts Formed by Reactive RF Sputtering

Haruo Yamagishi · Japanese Journal of Applied Physics · 1984 · 50 citations

Engineering, Electrical Engineering, Materials Science +17