Electron scattering in silicon inversion layers by oxide and surface roughness

Quantum Spectroscopy of the Low-Field Oscillations in the Surface Impedance

R. E. Prange, Tsu-Wei Nee · Physical Review · 1968 · 349 citations

Natural Sciences, Physics, Condensed Matter Physics +16

On the role of scattering by surface roughness in silicon inversion layers

Yingchun Cheng, E. A. Sullivan · Surface Science · 1973 · 162 citations

Natural Sciences, Materials Engineering, Materials Science +14

Oxide-Charge-Induced Impurity Level in Silicon Inversion Layers

A. Hartstein, A. B. Fowler · Physical Review Letters · 1975 · 79 citations

Engineering, Electrical Engineering, Materials Science +17

Theory of the carrier-density fluctuations in an IGFET near threshold

J.R. Brews · Journal of Applied Physics · 1975 · 78 citations · Full text

Engineering, Electrical Engineering, Microelectronics +16

Substrate Bias Effects on Electron Mobility in Silicon Inversion Layers at Low Temperatures

A. B. Fowler · Physical Review Letters · 1975 · 72 citations

Engineering, Electrical Engineering, Materials Science +17