X-ray analysis of strain in titanium nitride layers

X-ray diffraction procedures

Harold P. Klug, Leroy Alexander · CERN Document Server (European Organization for Nuclear Research) · 1954 · 4.2K citations

Use of the Voigt function in a single-line method for the analysis of X-ray diffraction line broadening

Th. H. de Keijser, J. I. Langford, E. J. Mittemeijer et al. · Journal of Applied Crystallography · 1982 · 1.2K citations

Natural Sciences, Materials Engineering, Materials Science +16

A rapid method for analysing the breadths of diffraction and spectral lines using the Voigt function

J. I. Langford · Journal of Applied Crystallography · 1978 · 621 citations

Natural Sciences, Materials Engineering, Materials Science +17

Mechanisms of reactive sputtering of titanium nitride and titanium carbide II: Morphology and structure

J.‐E. Sundgren, B.-O. Johansson, Susanne Karlsson et al. · Thin Solid Films · 1983 · 275 citations

Natural Sciences, Materials Engineering, Materials Science +16

The origins of stress in thin nickel films

Frank Anthony Doljack, R. W. Hoffman · Thin Solid Films · 1972 · 196 citations

Natural Sciences, Materials Engineering, Materials Science +12