Applied Physics Letters · 1992 · 69 citations · 13 references
Natural SciencesMaterials EngineeringMaterials ScienceOptical MaterialsPlasma PhysicsThin FilmsThin Film Optical PropertiesX-ray OpticsX-ray PolarimetryX-ray SpectroscopyOptical TransmittanceRadiation TransmittanceSoft X-ray OpticsTransmittance SpectroscopyX-ray Polarization MeasurementsX-ray Polarization OpticsX-ray Reflectivity
Phase retardation as a function of incidence angle of 97-eV soft x rays from a laser plasma source on transmission through a free-standing molybdenum/silicon multilayer was measured using a multilayer polarizer and a polarization analyzer. The maximum retardation of 49° between σ and π components is over 2/3 that calculated for an ideal structure. At maximum retardation the transmittance ratio of σ- to π-amplitudes was 0.66 and the intensity transmittance, averaged for both components, was 20%. These multilayer structures will be useful in soft x-ray polarization applications.
13
<i>Ellipsometry and Polarized Light</i>
R. M. A. Azzam, N. M. Bashara, Stanley S. Ballard · Physics Today · 1978 · 4.3K citations
Natural Sciences, Physics, Optics +13