Transmittance Spectroscopy

Transmittance Spectroscopy is an optical spectroscopic technique that measures the fraction of incident electromagnetic radiation transmitted through a semiconductor material as a function of wavelength or energy to characterize its optical properties, distinguishing itself from related methods by directly quantifying the spectral transmittance without reliance on reflectance or absorption calculations.

576

Publications

25.2K

Citations

2.2K

Authors

742

Institutions

Publications per year

2017–2026

104

Authors

2.2K

  1. AP
    Antonio Pifferi

    Politecnico di Milano, Italy

    5 publications · 487 citations

    5

    h-index

  2. JC
    Junhao Chu

    East China Normal University, China

    5 publications · 100 citations

    5

    h-index

  3. PT
    Paola Taroni

    Politecnico di Milano, Italy

    5 publications · 487 citations

    5

    h-index

  4. JF
    John F. Kadla

    University of British Columbia, Canada

    4 publications · 294 citations

    4

    h-index

  5. IL
    Ignazio L. Fragalà

    University of Catania, Italy

    4 publications · 211 citations

    4

    h-index

1–5 of 2.2K

Venues

  1. Applied Optics

    35 publications · 1.3K citations

    20

    h-index

  2. Journal of the Optical Society of America

    JOSA · 25 publications · 781 citations

    16

    h-index

  3. Applied Spectroscopy

    14 publications · 515 citations

    12

    h-index

  4. Applied Physics Letters

    14 publications · 639 citations

    12

    h-index

  5. Journal of Near Infrared Spectroscopy

    JNIRS · 10 publications · 1K citations

    10

    h-index

1–5