Quantitative dopant distributions in GaAs nanowires using atom probe tomography - Concepedia

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Quantitative dopant distributions in GaAs nanowires using atom probe tomography

31

Citations

37

References

2013

Year

Sichao Du, Timothy Burgess, Baptiste Gault, Qiang Gao, Peite Bao, Li Li, Xiangyuan Cui, W. K. Yeoh, Hongwei Liu, Lan Yao,

Ultramicroscopy

PhysicsMicroscopyApplied PhysicsQuantitative Dopant DistributionsCompound SemiconductorSemiconductor DeviceSemiconductor Nanostructures

References

	Year	Citations

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