Publication | Closed Access
Physical Modeling of Negative Bias Temperature Instabilities for Predictive Extrapolation
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Citations
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References
2006
Year
Unknown Venue
EngineeringSemiconductor DeviceUncertainty QuantificationPhysical ModelingNumerical SimulationModeling And SimulationThermal ModelingThermodynamicsComputational ElectromagneticsNbti DegradationDevice ModelingElectrical EngineeringPhysicsBias Temperature InstabilityTime-dependent Dielectric BreakdownForecastingHeat TransferMicroelectronicsHole TrappingInterface Traps CreationStress-induced Leakage CurrentApplied PhysicsTheoretical Prediction
Based on new insights on measurement methodologies, interface traps creation and hole trapping as root causes of NBTI degradation are investigated in this paper. Physical modeling is proposed and the related extrapolation laws are discussed
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