Physical Review Letters · 1992 · 141 citations · 12 references
Natural SciencesMaterials EngineeringMaterials ScienceMechanical Behavior Of MaterialsSurface ScienceThin FilmsAtomic Force MicroscopyNanomechanicsScanning Probe MicroscopyStress RelaxationSurface PhysicsThin Film Mechanical PropertiesFilm-substrate InteractionInterface PassivationMechanical Properties Of FilmsMonolayer FilmsMonolayersOrganic Thin FilmsPassivationSelf-assembled Monolayers
Using the newly developed interfacial-force microscope, we present results for the first measurements of the mechanical relaxation of a Au supported, self-assembled monolayer film interacting with a microscopic tungsten tip. For a methyl-terminated n-alkanethiol film, we observe negligible adhesive film-tip interaction and complete passivation of tip-substrate bonding. The mechanical behavior of the film itself shows a time-dependent, elastic response.
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