European Journal of Pharmaceutics and Biopharmaceutics · 2004 · 24 citations · 15 references
ComputingVisualizationMaterial VisualizationSurface MetrologySurface RoughnessSurface Roughness EffectsSurface VisualizationTerrain RoughnessTopographic VisualizationRoughnessRoughness MappingSurface Roughness Visualization
15
Analyzing atomic force microscopy images using spectral methods
S. Fang, S. Haplepete, W. Chen et al. · Journal of Applied Physics · 1997 · 149 citations
Natural Sciences, Materials Science, Materials Characterization +16