High precision x-ray metrology

X-Ray to Visible Wavelength Ratios

Richard D. Deslattes, Albert Henins · Physical Review Letters · 1973 · 332 citations

Natural Sciences, Materials Science, Physics +15

Absolute Measurement of the (220) Lattice Plane Spacing in a Silicon Crystal

Peter Becker, K. Dorenwendt, G. Ebeling et al. · Physical Review Letters · 1981 · 221 citations

Natural Sciences, Materials Science, Physics +13

Principles and design of Laue-case X-Ray interferometers

U. Bonse, Michael Hart · The European Physical Journal A · 1965 · 188 citations

Natural Sciences, Physics, Instrumentation +8

Lattice distortions induced by carbon in silicon

Dominic Windisch, Peter Becker · Philosophical magazine. A/Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties · 1988 · 86 citations

Natural Sciences, Materials Engineering, Materials Science +17

Determination of silicon unit cell parameters by precision measurements of Bragg plane spacings

H. Siegert, Peter Becker, Peter Seyfried · The European Physical Journal B · 1984 · 26 citations

Engineering, Materials Engineering, Materials Science +14