Dominic Windisch

Silicon lattice parameters as an absolute scale of length for high precision measurements of fundamental constants

Dominic Windisch, Peter Becker · physica status solidi (a) · 1990 · 146 citations

Engineering, Measurement, Education +20

Lattice distortions induced by carbon in silicon

Dominic Windisch, Peter Becker · Philosophical magazine. A/Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties · 1988 · 86 citations

Engineering, Silicon On Insulator, Lattice Distortions +16

Remeasurement of the CuKα1 Emission X-Ray Wavelength in the Metrical System (Present Stage)

J. Härtwig, Peter Becker, Dominic Windisch · physica status solidi (a) · 1991 · 57 citations

X-ray Crystallography, X-ray Spectroscopy, Simultaneous X-ray +20

Angular measurements with X-ray interferometry

Dominic Windisch, Peter Becker · Journal of Applied Crystallography · 1992 · 37 citations

Photonics, X-ray Spectroscopy, Rapid Oscillations +15

High precision x-ray metrology

Peter Seyfried, Peter Becker, Dominic Windisch · Precision Engineering · 1988 · 18 citations

Engineering, Microscopy, Calibration +7