Peter Seyfried

Absolute Measurement of the (220) Lattice Plane Spacing in a Silicon Crystal

Peter Becker, K. Dorenwendt, G. Ebeling et al. · Physical Review Letters · 1981 · 220 citations

Crystal Structure, Optical Materials, Engineering +20

Determination of silicon unit cell parameters by precision measurements of Bragg plane spacings

H. Siegert, Peter Becker, Peter Seyfried · The European Physical Journal B · 1984 · 26 citations

Electrical Engineering, Precision Measurement, Engineering +13

The Avogadro constant — Recent results on the molar volume of silicon

Peter Seyfried, R. Balhorn, Manfred Kochsiek et al. · IEEE Transactions on Instrumentation and Measurement · 1987 · 26 citations

Crystal Structure, Engineering, Silicon Crystals +16

Translation stage for a scanning x-ray optical interferometer

Peter Becker, Peter Seyfried, H. Siegert · Review of Scientific Instruments · 1987 · 19 citations

Engineering, Mechanical Engineering, Interferometry +19

High precision x-ray metrology

Peter Seyfried, Peter Becker, Dominic Windisch · Precision Engineering · 1988 · 18 citations

Engineering, Microscopy, Calibration +7