Concepedia

Publication | Closed Access

Recent progress in thin film growth analysis by multichannel spectroscopic ellipsometry

DOI

47

Citations

27

References

2000

Year

R. W. Collins, Joohyun Koh, Hiroyuki Fujiwara, P. I. Rovira, André S. Ferlauto, Juan Antonio Zapien, C. R. Wronski, R. Messier
Applied Surface Science

References

YearCitations

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