Direct measurement of tapping force with a cantilever deflection force sensor

References

Page 1

	Year	Citations
Dynamic atomic force microscopy methods Surface Science Reports EngineeringPhysicsMicroscopyMechanicsMicroscopy Method	2002	2K
Fractured polymer/silica fiber surface studied by tapping mode atomic force microscopy Qian Zhong, Daryl Inniss, K. Kjoller, Surface Science Materials ScienceFiber ReinforcementEngineeringMechanicsApplied Physics	1993	891
Attractive and repulsive tip-sample interaction regimes in tapping-mode atomic force microscopy Ricardo Garcı́a, Álvaro San Paulo Physical review. B, Condensed matter EngineeringMicroscopyMechanical EngineeringSoft MatterLarge Free Amplitudes	1999	560
CHARACTERIZATION OF POLYMER SURFACES WITH ATOMIC FORCE MICROSCOPY Sergei Magonov, Darrell H. Reneker Annual Review of Materials Science Materials ScienceAtomic Force MicroscopyEngineeringMicroscopyAtomic Force Microscope	1997	432
Capillary forces in tapping mode atomic force microscopy L. Zitzler, Stephan Herminghaus, Frieder Mugele Physical review. B, Condensed matter EngineeringMicroscopyWettingSoft MatterMicroscopy Method	2002	300
Experimental Observation of Forces Acting during Scanning Tunneling Microscopy U. Dürig, James K. Gimzewski, Dieter Pohl Physical Review Letters EngineeringMicroscopyMechanical EngineeringNanotribologyExperimental Observation	1986	284
Cantilever dynamics in quasinoncontact force microscopy: Spectroscopic aspects Boris Anczykowski, Daniel H. Kruger, Harald Fuchs Physical review. B, Condensed matter EngineeringMicroscopyMechanicsContact MechanicBiomechanics	1996	255
Theoretical investigation of the distance dependence of capillary and van der Waals forces in scanning force microscopy Thomas Stifter, Othmar Marti, Bharat Bhushan Physical review. B, Condensed matter EngineeringMicroscopyMechanical EngineeringWettingForce Microscopy	2000	239
Dynamics of a vibrating tip near or in intermittent contact with a surface Ricardo Garcı́a, Álvaro San Paulo Physical review. B, Condensed matter EngineeringMicroscopyFluid MechanicsMechanical EngineeringHaptic Technology	2000	196
Fourier transformed atomic force microscopy: tapping mode atomic force microscopy beyond the Hookian approximation Robert W. Stark, Wolfgang M. Heckl Surface Science Atomic Force MicroscopyEngineeringElectron MicroscopyPhysicsMicroscopy	2000	162

Page 1