Journal of Physics D Applied Physics · 1999 · 33 citations · 5 references
EngineeringElectrical EngineeringMicroelectronicsSurface EngineeringSurface ScienceSurface ChargeSurface MetrologySurface RoughnessSurface Roughness EffectsCapacitanceElectrode CapacitanceParallel-plate CapacitorsRoughness ModelingRoughness ParametersSurface Roughness AnalysisSurface Roughness ParametersThin Film Surface Roughness
We consider the electrical capacitance of a parallel-plate capacitor with one rough electrode. The roughness is characterized by its amplitude and its wavenumber scale; the capacitance depends on both of these variables as well as the form of the roughness. We calculate the capacitance in the four limit cases of the two variables mentioned above. On the basis of these limit cases, we approximate the capacitance with elementary functions for the case of any surface roughness. We compare the capacitances calculated in this approach with precise numerical solutions for different forms of roughness.
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Near-field scanning microwave microscope with 100 μm resolution
C. P. Vlahacos, R. C. Black, Steven M. Anlage et al. · Applied Physics Letters · 1996 · 114 citations
Augusto Garcı́a-Valenzuela, Neil C. Bruce, Dmitri Kouznetsov · Journal of Physics D Applied Physics · 1998 · 15 citations
Natural Sciences, Electrical Engineering, Circuit Theory +16