Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1986 · 10 citations · 10 references
EngineeringMaterials SciencePhysicsElectronic MaterialsInterface ScienceSemiconductor MaterialsDevice CharacterizationOxide SemiconductorsSemiconductor Device MaterialsSemiconductor InterfacesSemiconductor SurfacesBackscatteringRutherford Backscattering SpectrometrySemiconductor Characterization
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Raman scattering from anodic oxide-GaAs interfaces
G. P. Schwartz, B. Schwartz, Doreen Distefano et al. · Applied Physics Letters · 1979 · 62 citations