Concepedia

Crystal structures and their secondary ion mass spectra

R. Buhl, A. Preisinger

Surface Science · 1975 · 49 citations · 5 references

DOI

Concepts

References

5

Surface investigation of solids by the statical method of secondary ion mass spectroscopy (SIMS)

A. Benninghoven · Surface Science · 1973 · 447 citations

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Defects in crystalline solids

D.D. · Journal of Molecular Structure · 1973 · 177 citations

, , +12

Electronic Characterization of Solid Surfaces

H. D. Hagstrum · Science · 1972 · 77 citations

, , +15

Application of characteristic secondary ion mass spectra to a depth analysis of copper oxide on copper

H. W. Werner, H. A. M. de Grefte, J. Van Den Berg · Radiation Effects · 1973 · 47 citations

, , +12

An Analytical System for Secondary Ion Mass Spectrometry in Ultra High Vacuum

W. Huber, Hubert Selhofer, A. Benninghoven · Journal of Vacuum Science and Technology · 1972 · 21 citations · Full text

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