Electrical and Chemical Studies on Al2O3 Passivation Activation Process

An investigation of surface states at a silicon/silicon oxide interface employing metal-oxide-silicon diodes

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Description of the SiO2Si interface properties by means of very low frequency MOS capacitance measurements

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Electronic and chemical properties of the c-Si/Al2O3 interface

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Experimental evidence of parasitic shunting in silicon nitride rear surface passivated solar cells

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Effective surface passivation of crystalline silicon using ultrathin Al₂O₃ films and Al₂O₃/SiN<i>_x</i> stacks

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