Improved noise model for MESFETs and HEMTs in lower gigahertz frequency range

P. Heymann, H. Prinzler

Electronics Letters · 1992 · 13 citations · 2 references

Concepts

Abstract

A noise model based on an equivalent circuit is applied to an HEMT. Besides the frequency dependence of the most important noise parameters (Fmin, Xopt, Xopt, RN) two apparent experimental facts are explained: the limited Ropt, Xopt and the increase of RN with decreasing frequency.

References

2