Physical Review Letters · 1990 · 325 citations · 13 references
EngineeringMaterials EngineeringMaterials ScienceSemiconductor MaterialsSurface ScienceThin FilmsAmorphous SemiconductorsEpitaxial GrowthSemiconductor InterfacesSemiconductor PhysicsSemiconductor SurfacesSemiconductor Thin FilmsActivation EnergyEpitaxial Film GrowthEpitaxial Growth KineticsEpitaxial Thin-film GrowthMolecular Beam EpitaxyMolecular Beam Epitaxy KineticsSilicon EpitaxySurface Growth
Si molecular-beam epitaxy (MBE) on smooth Si(100) surfaces is shown to occur at room temperature. We demonstrate for the first time that Si deposition becomes amorphous after growth of a limiting epitaxial thickness (${\mathit{h}}_{\mathrm{epi}}$). ${\mathit{h}}_{\mathrm{epi}}$ is \ensuremath{\approxeq}10--30 \AA{} at room temperature and increases rapidly at higher temperatures with a rate-dependent activation energy in the range 0.4--1.5 eV. The effect is tentatively linked to surface roughening during growth at low temperatures, and is probably general in MBE, also occurring for Si/Si(111), Ge/Si(100, and GaAs/GaAs(100).
13
Ion-Neutralization Spectroscopy of Solids and Solid Surfaces
H. D. Hagstrum · Physical Review · 1966 · 234 citations