Chinese Physics Letters · 2002 · 23 citations · 15 references
Natural SciencesMaterials EngineeringMaterials ScienceElectronic MaterialsSemiconductor MaterialsThin FilmsConductive MaterialsDopingInorganic MaterialsMetal OxidesOxide SemiconductorsSemiconductor Device MaterialsCharge Carrier DensityConductionN-type ConductivityN-type Oxide SemiconductorsP-type Oxide SemiconductorsSemiconductor Oxide Thin FilmsZinc Oxides
We report on N-doped p-type ZnO films with the c-axis parallel to the substrate. ZnO films were prepared on an α-Al2O3 (0001) substrate by solid-source chemical vapour deposition (CVD). Zn(CH3COO)2·2H2O was used as the precursor and CH3COONH4 as the nitrogen source. The growth temperature was varied from 300°C to 600°C. The as-grown ZnO film deposited at 500°C showed p-type conduction with its resistivity of 42 Ωcm, carrier density 3.7×1017 cm-3 and Hall mobility 1.26 cm2V-1·s-1 at room temperature, which are the best properties for p-type ZnO deposited by CVD. The p-type ZnO film possesses a transmittance of about 85% in the visible region and a bandgap of 3.21 eV at room temperature.
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