Thin-film reactions of Al with Co, Cr, Mo, Ta, Ti, and W

Algorithms for the rapid simulation of Rutherford backscattering spectra

Lawrence Doolittle · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1985 · 2.8K citations

Natural Sciences, Computational Engineering, Physics +10

Thin Films—Interdiffusion and Reactions

J. M. Poate, K. N. Tu, Jean-Claude Mayor et al. · Journal of The Electrochemical Society · 1979 · 1.7K citations

Natural Sciences, Materials Engineering, Materials Science +12

Diffusion barriers in layered contact structures

M-A. Nicolet, M. Bartur · Journal of Vacuum Science and Technology · 1981 · 169 citations

Natural Sciences, Materials Engineering, Materials Science +17

Intermetallic compounds of Al and transitions metals: Effect of electromigration in 1–2-μm-wide lines

J. K. Howard, J.F. White, Paul S. Ho · Journal of Applied Physics · 1978 · 143 citations

Natural Sciences, Materials Engineering, Materials Science +14

Kinetics of compound formation in thin film couples of Al and transition metals

J. K. Howard, R. F. Lever, Patrick J. Smith et al. · Journal of Vacuum Science and Technology · 1976 · 110 citations

Natural Sciences, Chemistry, Materials Science +17