Applied Physics Letters · 1997 · 65 citations · 13 references
EngineeringMaterials EngineeringMaterials ScienceElectronic MaterialsSemiconductor MaterialsSpectroscopyDopingIii-v SemiconductorsSemiconductor Device MaterialsSemiconductor PhysicsWide Band Gap SemiconductorsWide-bandgap SemiconductorsElectroluminescenceExcitationExciton Binding EnergyExcitonsGallium NitrideGallium Nitride (Gan) MaterialsPhotoluminescenceResistivity
The temperature and excitation power dependence of a bound exciton photoluminescence line S with a localization energy Q=11.5 meV has been studied in undoped and moderately Mg-doped wurtzite GaN of high resistivity. The data provide strong evidence that line S is due to recombination of excitons bound to ionized shallow donors. The consistency of this assignment with theoretical predictions is demonstrated.
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Optical Properties of Substitutional Donors in ZnSe
J. L. Merz, Hiroshi Kukimoto, K. Nassau et al. · Physical review. B, Solid state · 1972 · 301 citations
Excitonic emissions from hexagonal GaN epitaxial layers
Shigefusa F. Chichibu, T. Azuhata, T. Sota et al. · Journal of Applied Physics · 1996 · 173 citations
Natural Sciences, Materials Engineering, Materials Science +17