2010 · 13 citations · 8 references
EngineeringElectrical EngineeringMicroelectronicsSemiconductor DevicesSensorsDetector TechnologyInfrared DetectorsInfrared InstrumentationPhotodetectorsSemiconductor DetectorsDetector Readout ElectronicsFocal Plane ArraysFocal Plane DetectorsInfrared ArraysInfrared Detector ArraysPixel ArchitectureReadout Integrated CircuitsTemperature Sensitivity
This paper describes the development of a readout integrated circuit coupled to a 160×120-pixels infrared focal plane array (IR-FPA) based on micro-bolometric detectors. The readout circuit includes 5-bit in-pixel memory and dedicated circuitry for automatic calibration of the array offset non-uniformity, 8 selectable columns of reference pixels, and four high-sensitivity temperature sensors to monitor FPA temperature. The integrated circuit has been fabricated in a standard CMOS 0.5μm 2P3M 3.3/5V technology and subsequently processed to build the vanadium oxide bolometers having a pitch of 52μm. Electrical and electro-optical tests have been performed: the chip operates at 50fps with NETD=0.33K (dynamic vacuum, optics with F/#=1.2) dissipating 80mW, with up to 32x offset reduction.
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C. Minassian, J. L. Tissot, M. Vilain et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2008 · 23 citations