Impact of endurance degradation on the programming efficiency and the energy consumption of NOR flash memories

A 45nm generation Phase Change Memory technology

G. Servalli · 2009 · 186 citations

Engineering, Electrical Engineering, Materials Science +14

A 4Mb conductive-bridge resistive memory with 2.3GB/s read-throughput and 216MB/s program-throughput

Wataru Otsuka, Koji Miyata, Makoto Kitagawa et al. · 2011 · 70 citations

Engineering, Computer Engineering, Electrical Engineering +14

40-nm Embedded Split-Gate MONOS (SG-MONOS) Flash Macros for Automotive With 160-MHz Random Access for Code and Endurance Over 10 M Cycles for Data at the Junction Temperature of 170 $^{\circ}$C

Takashi Kono, Takashi Ito, Tsuruda Tamaki et al. · IEEE Journal of Solid-State Circuits · 2013 · 35 citations

Engineering, Computer Engineering, Electrical Engineering +17

Assessment of distributed-cycling schemes on 45nm NOR flash memory arrays

Carmine Miccoli, Christian Monzio Compagnoni, Luca Chiavarone et al. · 2012 · 14 citations

Engineering, Computer Engineering, Electrical Engineering +17

Push the flash floating gate memories toward the future low energy application

V. Della Marca, G. Just, A. Régnier et al. · Solid-State Electronics · 2012 · 13 citations · Full text

Engineering, Computer Engineering, Computer Science +14