Growth of GaAs-Al-GaAs by migration-enhanced epitaxy

B. Tadayon, S. Tadayon, Michael G. Spencer, G. L. Harris, L. Rathbun, J. T. Bradshaw, W. J. Schaff, P.J. Tasker, L.F. Eastman

Applied Physics Letters · 1988 · 12 citations · 15 references

Concepts

Abstract

The GaAs-Al-GaAs structure is grown using migration-enhanced epitaxy (MEE) method at low temperature on a molecular beam epitaxy machine. With MEE the interdiffusion between Al and GaAs is reduced by a large amount, and the morphology is improved by a large degree. Still, Raman spectrum indicates poor crystallinity for the GaAs of the top layer. The effect of different annealing temperatures on the interdiffusion is also studied.

References

15