Japanese Journal of Applied Physics · 2010 · 22 citations · 25 references
Natural SciencesMaterials EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesSemiconductor MaterialsChemical Vapor DepositionCrystal GrowthCrystallographySemiconductor Crystal GrowthSilicon MaterialsX-ray DiffractionAmorphous CarbonCarrier GasesLow-temperature GrowthPlasma-assisted Chemical Vapor DepositionPlasma-enhanced Chemical Vapor DepositionTemperature DependenceTemperature-dependent GrowthX-ray Diffraction Analysis
In this study, networked nanographite is formed on a Si substrate without any metal catalysts by photoemission-assisted plasma-enhanced chemical vapor deposition. We investigated the carrier gas dependence of the crystallographic quality of networked nanographite when Ar and He are used as the carrier gases. When Ar is the carrier gas, Raman spectroscopy and grazing incident X-ray diffraction show that the crystallographic quality deteriorates makedly with decreasing growth temperature, indicating that amorphous carbon is deposited at low temperatures (below ∼500 °C). On the other hand, when He gas is used as a carrier gas, a high quality nanographite can be grown even at temperatures as low as room temperature. Thus, there is a significant difference in the temperature dependence of crystallographic quality for the two carrier gases.
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