Concepedia

High-resolution X-ray study of specular and diffuse scattering from Ni/C multilayer upon annealing

V. A. Chernov, E.D Chkhalo, N.V. Kovalenko, S.V. Mytnichenko

Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 2000 · 13 citations · 11 references

DOI

Concepts

References

11

Surface Studies of Solids by Total Reflection of X-Rays

L. G. Parratt · Physical Review · 1954 · 5.1K citations

, , +17

Nonspecular x-ray reflection from rough multilayers

V. Holý, Tilo Baumbach · Physical review. B, Condensed matter · 1994 · 519 citations

, , +16

Determination of roughness correlations in multilayer films for x-ray mirrors

D. E. Savage, Jonas Kleiner, N. Schimke et al. · Journal of Applied Physics · 1991 · 295 citations

, , +18

X-ray reflection from rough layered systems

V. Holý, J. Kuběna, I. Ohli ́dal et al. · Physical review. B, Condensed matter · 1993 · 284 citations

, , +13

X-ray scattering from interfacial roughness in multilayer structures

D. G. Stearns · Journal of Applied Physics · 1992 · 145 citations

, , +12