J. Kuběna

X-ray reflection from rough layered systems

V. Holý, J. Kuběna, I. Ohli ́dal et al. · Physical review. B, Condensed matter · 1993 · 284 citations

Engineering, Surface Reflectance, Physics +13

X-ray double and triple crystal diffractometry of mosaic structure in heteroepitaxial layers

V. Holý, J. Kuběna, E. Abramof et al. · Journal of Applied Physics · 1993 · 85 citations

X-ray Crystallography, Engineering, Microscopy +18

X‐Ray Analysis of Structural Defects in a Semiconductor Superlattice

V. Holý, J. Kuběna, K. Ploog · physica status solidi (b) · 1990 · 37 citations

N Superlattice, Engineering, Crystal Growth Technology +16

On the Integrated Intensity of X‐Ray Diffraction in Crystals with Randomly Distributed Defects

V. Holý, J. Kuběna · physica status solidi (b) · 1989 · 36 citations

X-ray Crystallography, Optical Materials, Engineering +20

X‐Ray Reflection Curves of Si Crystals with Microdefects in the Laue Case

V. Holý, J. Kuběna · physica status solidi (b) · 1987 · 35 citations

X-ray Crystallography, Engineering, Microscopy +21