Crystallinity of the mixed phase silicon thin films by Raman spectroscopy

<scp>WSXM</scp>: A software for scanning probe microscopy and a tool for nanotechnology

Ignacio Horcas, Robert Fernandez, José M. Gómez‐Rodríguez et al. · Review of Scientific Instruments · 2007 · 7.7K citations · Full text

Natural Sciences, Materials Engineering, Materials Science +7

Factor Analysis in Chemistry

Larry G. Blackwood, Edmund R. Malinowski · Technometrics · 1994 · 2.2K citations

Natural Sciences, Chemistry, Physical Chemistry +2

Factor Analysis in Chemistry

Technometrics · 2003 · 464 citations

Natural Sciences, Chemistry, Physical Chemistry +2

Determining the material structure of microcrystalline silicon from Raman spectra

C. Smit, R.A.C.M.M. van Swaaij, H. Donker et al. · Journal of Applied Physics · 2003 · 385 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +17

Critical volume fraction of crystallinity for conductivity percolation in phosphorus-doped Si:F:H alloys

Raphael Tsu, J. González‐Hernández, S. S. Chao et al. · Applied Physics Letters · 1982 · 356 citations

Natural Sciences, Materials Science, Physics +17