A. Fejfar - Concepedia

Author

A. Fejfar

FZU ‒ Institute of Physics of the Academy of Sciences of the Czech Republic ORCID

Also Known As

A Fejfar, A. FEJFAR, A. Fejfar, Antonin Fejfar, Antonín Fejfar, Antonn Fejfar, Antonín Fejfar, Duong, D.P., Fejfar, A., Hakl, M.

196

Publications

3.2K

Citations

H-Index

Concepts

All Affiliations

FZU ‒ Institute of Physics of the Academy of Sciences of the Czech Republic Czech Academy of Sciences Charles University Czech Academy of Sciences, J. Heyrovský Institute of Physical Chemistry École Polytechnique Fédérale de Lausanne

About

A. Fejfar is an author at FZU ‒ Institute of Physics of the Academy of Sciences of the Czech Republic specializing in applied physics, engineering, and materials science.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	25	68	2.4K
2	Applied Physics	25	65	2.4K
3	Natural Sciences	2	2	326
4	Education	1	1	24
5	Medicine	1	1	11

A. Fejfar

Publications

2.9K

Citations

H-Index

Page 1

	Year	Citations
Temperature Dependence of the Urbach Energy in Lead Iodide Perovskites Martin Ledinský, Tereza Schönfeldová, Jakub Holovský, The Journal of Physical Chemistry Letters	2019	284
Optical absorption and light scattering in microcrystalline silicon thin films and solar cells A. Poruba, A. Fejfar, Z. Remeš, Journal of Applied Physics Optical MaterialsEngineeringOptical AbsorptionPhotovoltaic DevicesHigh Frequency	2000	252
Raman Spectroscopy of Organic–Inorganic Halide Perovskites Martin Ledinský, Philipp Löper, Bjoern Niesen, The Journal of Physical Chemistry Letters Materials ScienceInorganic ChemistryEngineeringPure Pbi2Distinct Raman	2015	233
Size and Purity Control of HPHT Nanodiamonds down to 1 nm Štěpán Stehlík, M. Varga, Martin Ledinský, The Journal of Physical Chemistry C Materials ScienceNanocrystalline MaterialDiamond-like CarbonNanoscale SystemHpht Nanodiamonds	2015	182
Passivating electron contact based on highly crystalline nanostructured silicon oxide layers for silicon solar cells Josua Stückelberger, Gizem Nogay, Philippe Wyss, Solar Energy Materials and Solar Cells Materials ScienceEngineeringElectron ContactOxide ElectronicsApplied Physics	2016	104
Direct measurement of the deep defect density in thin amorphous silicon films with the ‘‘absolute’’ constant photocurrent method M. Vaněček, J. Kočka, A. Poruba, Journal of Applied Physics Optical MaterialsEngineeringOptical TestingDeep Defect DensityOptoelectronic Devices	1995	93
Ultrafast carrier dynamics in microcrystalline silicon probed by time-resolved terahertz spectroscopy Ladislav Fekete, P. Kužel, H. Němec, Physical Review B Materials ScienceTerahertz SpectroscopyTime-resolved Terahertz SpectroscopyPhysicsEngineering	2009	87
Microcrystalline silicon thin films studied by atomic force microscopy with electrical current detection Bohuslav Rezek, J. Stuchlı́k, A. Fejfar, Journal of Applied Physics Atomic Force MicroscopyEngineeringElectrical Current DetectionMicroscopySame Layer Thickness	2002	75
Local characterization of electronic transport in microcrystalline silicon thin films with submicron resolution Bohuslav Rezek, J. Stuchlı́k, A. Fejfar, Applied Physics Letters Submicron ResolutionEngineeringLocal CharacterizationOptoelectronic DevicesSilicon On Insulator	1999	71
Basic features of transport in microcrystalline silicon J. Kočka, A. Fejfar, H. Stuchlı́ková, Solar Energy Materials and Solar Cells EngineeringPhysicsMicrofabricationApplied PhysicsTransport Phenomena	2003	61

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