Low-Energy Electron Diffraction during Pulsed Laser Annealing: A Time- Resolved Surface Structural Study

Abstract

Nanosecond structural changes in a crystal lattice during pulsed laser annealing have been measured by use of time-resolved low-energy electron diffraction. Low-energy electron diffraction is both structure and surface (\ensuremath{\sim} 10 \AA{}) sensitive and can yield lattice temperatures from Debye-Waller-like extinction coefficients. Combining these with nanosecond time resolution provides a surface probe for short-time dynamical processes. The results demonstrate rapid formation of a liquid layer and subsequent surface recrystallization and cooling on (111) Ge.