Time-resolved Diffraction

Time-Resolved Diffraction is a specialized X-ray diffraction technique that distinguishes itself by capturing dynamic structural changes in materials at discrete time intervals during physical, chemical, or biological processes, enabling the analysis of transient states and reaction mechanisms at atomic resolution.

716

Publications

38.2K

Citations

3K

Authors

721

Institutions

Publications per year

2017–2026

115

Authors

3K

  1. JC
    Jonathan C. Hanson

    Brookhaven National Laboratory, United States

    32 publications · 2.9K citations

    25

    h-index

  2. JA
    José A. Rodríguez

    Brookhaven National Laboratory, United States

    22 publications · 2.6K citations

    20

    h-index

  3. MW
    Michaël Wulff

    European Synchrotron Radiation Facility, France

    20 publications · 2.9K citations

    19

    h-index

  4. PC
    Philip Coppens

    University at Buffalo, State University of New York, United States

    17 publications · 912 citations

    17

    h-index

  5. HI
    Hyotcherl Ihee

    Korea Advanced Institute of Science and Technology, South Korea

    12 publications · 1.2K citations

    12

    h-index

1–5 of 3K

Venues

  1. Physical Review Letters

    PRL · 30 publications · 2.4K citations

    26

    h-index

  2. Applied Physics Letters

    33 publications · 1.4K citations

    23

    h-index

  3. Review of Scientific Instruments

    36 publications · 1.2K citations

    21

    h-index

  4. Journal of Applied Physics

    28 publications · 1.7K citations

    19

    h-index

  5. The Journal of Physical Chemistry C

    18 publications · 1.1K citations

    16

    h-index

1–5