Journal of Applied Physics · 1978 · 39 citations · 13 references
EngineeringElectrical EngineeringMaterials ScienceElectronic MaterialsOptoelectronicsSemiconductor DevicesDevice ReliabilityLaser DiodesLaser PhysicsSemiconductor DefectsSemiconductor LasersSemiconductor ReliabilityDefect KineticsDevice DegradationLasersLifetime EstimationNonradiative RecombinationPhotoluminescenceReliability Degradation MechanismsTemperature Dependence
An investigation into the effects of temperature on degradation mechanisms in GaAs/GaAlAs DH lasers has been carried out. A mechanism (or mechanisms) independent of stimulated light levels is found to be relatively insensitive to temperature. This suggests that a residual failure mechanism may be associated with defect motion being enhanced by nonradiative recombination. A statistical analysis of the lifetest results and photoluminescence studies of lifetested devices suggest that there may be different mechanisms in operation at different temperatures. Thus, great care must be exercised before using conventional extrapolation techniques to predict laser lives at room temperature.
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Al2O3 half-wave films for long-life cw lasers
I. Ladany, M. Ettenberg, H. F. Lockwood et al. · Applied Physics Letters · 1977 · 92 citations