Applied Physics Letters · 2002 · 32 citations · 23 references
Natural SciencesMaterials SciencePhysicsOptoelectronicsPhotonicsSemiconductor MaterialsOptical Properties Of SemiconductorsOptical Properties Of SolidsQuantum DotsScanning Probe MicroscopySemiconductor NanomaterialsSemiconductor SurfacesEmission SpectraEmission SpectrumEmission Spectrum CalculationOptical PropertiesPhoton MappingSelf-assembled Quantum DotsSemiconductor Quantum DotsSurface Optical Properties
Scanning tunneling microscopy (STM) and scanning tunneling luminescence (STL) have been used to investigate the geometric and optical properties of individual self-assembled InP quantum dots overgrown with a thin layer of GaInP. STL spectra and monochromatic photon maps were used to correlate the surface topography with the optical properties of single quantum dots. We find a spatial resolution of about 10 nm in the photon maps. Theoretical emission spectra were calculated by six-band k⋅p theory using a realistic shape of the dot as well as of the cap layer. The calculated emission spectrum of a single dot is in good agreement with the experimental findings.
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Surface Studies by Scanning Tunneling Microscopy
G. Binnig, H. Rohrer, Ch. Gerber et al. · Physical Review Letters · 1982 · 4.6K citations · Full text
Photon emission experiments with the scanning tunnelling microscope
J. H. Coombs, James K. Gimzewski, B. Reihl et al. · Journal of Microscopy · 1988 · 225 citations
Enhanced Photon Emission in Scanning Tunnelling Microscopy
James K. Gimzewski, J.K. Sass, R. R Schlitter et al. · Europhysics Letters (EPL) · 1989 · 182 citations