Structure analysis of the NiSi2/(111)Si interface by the X-ray standing wave method

Dynamical Diffraction of X Rays by Perfect Crystals

B. W. Batterman, H. Cole · Reviews of Modern Physics · 1964 · 1.4K citations

X-ray Crystallography, Engineering, Dynamical Diffraction +6

X-Ray Standing Waves at Crystal Surfaces

P. L. Cowan, J. A. Golovchenko, M. Robbins · Physical Review Letters · 1980 · 271 citations · Full text

X-ray Crystallography, X-ray Spectroscopy, Engineering +16

Atomic structure of the NiSi₂/(111)Si interface

D. Cherns, G. R. Anstis, J. L. Hutchison et al. · Philosophical magazine. A/Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties · 1982 · 252 citations

Materials Science, Semiconductors, Engineering +13

Observation of internal x-ray wave fields during Bragg diffraction with an application to impurity lattice location

J. A. Golovchenko, B. W. Batterman, W. L. Brown · Physical review. B, Solid state · 1974 · 153 citations · Full text

X-ray Crystallography, X-ray Spectroscopy, Dynamical Diffraction +17

Cross-sectional transmission electron microscopy of silicon-silicide interfaces

F. Föll, P Shing Ho, K. N. Tu · Journal of Applied Physics · 1981 · 139 citations

Materials Science, Epitaxial Growth, Engineering +13