Atomic structure of the NiSi₂/(111)Si interface

D. Cherns, G. R. Anstis, J. L. Hutchison, +1

Philosophical magazine. A/Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties

Materials ScienceSemiconductorsEngineeringSi InterfaceCrystalline Defects +11

Electron channelling contrast imaging of interfacial defects in strained silicon-germanium layers on silicon

A.J. Wilkinson, G. R. Anstis, Jan T. Czernuszka, +2

Philosophical magazine. A/Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties

EngineeringMicroscopyStrained Si1Silicon On InsulatorContrast Imaging +17

An approach to quantitative compositional profiling at near-atomic resolution using high-angle annular dark field imaging

Stuart Anderson, Christophe R. Birkeland, G. R. Anstis, +1

Ultramicroscopy

PhysicsMicroscopyQuantitative Compositional ProfilingSpectroscopyNatural Sciences +9

Investigation of amorphous materials by electron diffraction — The effects of multiple scattering

G. R. Anstis, Z. Liu, M. Lake

Ultramicroscopy

Materials ScienceMultiple ScatteringEngineeringMaterials CharacterizationApplied Physics +3

<i>n</i>-Beam lattice images. III. Upper limits of ionicity in W₄Nb₂₆O₇₇

G. R. Anstis, D. F. Lynch, A. F. Moodie, +1

Acta Crystallographica Section A

Quantum Lattice SystemEngineeringElectron DiffractionIon Beam InstrumentationChemistry +19

Light Splitting in Nanoporous Gold and Silver

Michel Bosman, G. R. Anstis, Vicki J. Keast, +2

ACS Nano

PlasmonicsOptical MaterialsContinuous GoldEngineeringPhysics +10

Limitations on the s-state approach to the interpretation of sub-angstrom resolution electron microscope images and microanalysis

G. R. Anstis, Dongchi Cai, D. J. H. Cockayne

Ultramicroscopy

S-state ApproachEngineeringElectron MicroscopyPhysicsMicroscopy +10

Formation of antiphase-domain boundary tubes in B2 ordered alloys by cross-slip and annihilation of screw dislocations

Chih‐Lung Chou, P. M. Hazzledine, P. B. Hirsch, +1

Philosophical magazine. A/Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties

Materials ScienceEngineeringDislocation InteractionCrystalline DefectsDislocation Dipoles +12

Dark-field electron microscopy of dissociated dislocations and surface steps in silicon using forbidden reflections

A. Ourmazd, G. R. Anstis, P. B. Hirsch

Philosophical magazine. A/Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties

EngineeringMicroscopyForbidden ReflectionElectron DiffractionDefect Tolerance +16

The calculation and interpretation of high-resolution electron microscope images of lattice defects

G. R. Anstis, D. J. H. Cockayne

Acta Crystallographica Section A

High Resolution ImagesEngineeringMicroscopyElectron DiffractionLattice Defects +16