Proceedings of the IEEE · 1964 · 42 citations · 1 references
EngineeringElectrical EngineeringElectronic MaterialsMicroelectronicsSemiconductor DevicesComplementary Metal-oxide-semiconductor TechnologyDevice ReliabilityField-effect TransistorsIntegrated Circuit DevicesMetal-oxide-semiconductor Field-effect TransistorsSemiconductor ReliabilityBreakdown CharacteristicsBreakdown MechanismsElectrical Breakdown
1