IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 2007 · 38 citations · 18 references
EngineeringComputer EngineeringElectrical EngineeringLow-power DesignMicroelectronicsSemiconductor DevicesCmos Circuit DesignComplementary Metal-oxide-semiconductor TechnologyLeakage Power ReductionMemory DevicesMemory Subsystem DesignDevice Pass-throughLeakageLeakage PowerLeakage Power OptimizationMemory Circuit DesignNon-volatile Memory DesignRandom Access Memory (Ram)Random-access Memory
A 6T static random access memory (SRAM) cell with a new write-assist (WA) feature is presented. The WA technique reduces the problem of writing a "one" through an nMOS pass device, thereby making a single-ended bit line more attractive. Both active power and leakage power can be significantly reduced. Leakage charge can be pooled to help precharge bit lines. Cell area and performance are competitive with traditional SRAM cell area and performance
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Low-leakage asymmetric-cell SRAM
Navid Azizi, Andreas Moshovos, Farid N. Najm · 2002 · 81 citations
Engineering, Computer Engineering, Electrical Engineering +17