Low frequency noise in MOS transistors—II Experiments

The effects of oxide traps on the MOS capacitance

F.P. Heiman, G. Warfield · IEEE Transactions on Electron Devices · 1965 · 437 citations

Engineering, Electrical Engineering, Materials Science +17

Low frequency noise in MOS transistors—I Theory

S. Christensson, Ingemar Lundström, C. Svensson · Solid-State Electronics · 1968 · 437 citations

Engineering, Electrical Engineering, Microelectronics +13

Investigation of thermally oxidised silicon surfaces using metal-oxide-semiconductor structures

Andrew S. Grove, B. E. Deal, E. H. Snow et al. · Solid-State Electronics · 1965 · 416 citations

Engineering, Materials Engineering, Materials Science +14

Lateral AC current flow model for metal-insulator-semiconductor capacitors

E. H. Nicollian, A. Goetzberger · IEEE Transactions on Electron Devices · 1965 · 138 citations

Engineering, Electrical Engineering, Materials Science +17

Limitations of the MOS capacitance method for the determination of semiconductor surface properties

K.H. Zaininger, G. Warfield · IEEE Transactions on Electron Devices · 1965 · 132 citations

Engineering, Electrical Engineering, Materials Science +17