Publication | Closed Access
Using heavy ion backscattering spectrometry (HIBS) to solve integrated circuit manufacturing problems
12
Citations
1
References
1998
Year
Electrical EngineeringIon ImplantationEngineeringAnalytical InstrumentationMass SpectrometryComputer EngineeringHeavy IonAnalytical ChemistryIon BeamIntegrated CircuitsElectronic PackagingInstrumentationMicroelectronicsIon Emission
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