A one‐film‐model ellipsometry program for the simultaneous calculation of protein film thickness and refractive index

Abstract

Abstract Heterogeneous protein films are not perfectly suited to ellipsometric analysis, and commercially available software often fails to yield meaningful optical properties for such films. Here, we describe a computer program uniquely suited for calculation of the thickness and refractive index of protein films. An important feature of the new program is an algorithm that allows a search for a solution in up to four directions.