Characterization and modeling of electrical stress degradation in STI-based integrated power devices - Concepedia

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Characterization and modeling of electrical stress degradation in STI-based integrated power devices

39

Citations

72

References

2014

Year

Susanna Reggiani, G. Barone, Elena Gnani, A. Gnudi, G. Baccarani, Stefano Poli, R. Wise, Ming-Yeh Chuang, Weidong Tian, S. Pendharkar,

Solid-State Electronics

Electrical Stress DegradationElectrical EngineeringEngineeringHardware ReliabilityPower DeviceDevice ReliabilityCircuit ReliabilityElectronic PackagingPower ElectronicsMicroelectronicsElectrical Insulation

References

	Year	Citations

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