Concepedia

Publication | Closed Access

Experimental and Numerical investigation about SEB/SEGR of Power MOSFET

DOI

30

Citations

9

References

2005

Year

G. Busatto, A. Porzio, F. Velardi, Francesco Iannuzzo, A. Sanseverino, Giuseppe Currò
Microelectronics Reliability

References

YearCitations

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