Journal of Applied Physics · 1975 · 38 citations · 13 references
Wide-bandgap SemiconductorAluminium NitrideOptical MaterialsEngineeringTemperature DependenceJunction TemperatureSemiconductorsOptical PropertiesQuantum MaterialsPeak WavelengthElectroluminescent LayersCompound SemiconductorPure GaasElectrical EngineeringPhotoluminescencePhysicsCrystalline DefectsOptoelectronic MaterialsSemiconductor MaterialSpontaneous Peak WavelengthCondensed Matter PhysicsApplied PhysicsOptoelectronics
We report the results of experiments which determine how the peak wavelength (λp) of the spontaneous emission spectrum shifts with junction temperature (T). The quantity ∂λp/∂T has been measured for homostructure, single−heterostructure, and double−heterostructure LED’s throughout the temperature range 293−413 °K. Particular emphasis was placed on how the presence of Al in a GaAs layer alters ∂λp/∂T. The principal results are as follows: (i) ∂λp/∂T ranges from 2.5 to 3.6 Å/°K for pure GaAs; (ii) ∂λp/∂T is decreased in direct proportion to the aluminum fraction x in Ga1−xAlxAs. An explanation of these results is presented which involves only the known magnitudes and temperature dependences of the direct energy band gaps of GaAs and AlAs; for example, at x=0.3, the calculated reduction is 35% which is in good agreement with the experimental data; (iii) the spectra for some LED’s have two peaks identified with band−to−band (BB) and band−to−acceptor (BA) recombination processes. For the BA peak ∂λp/∂T is 0.5 to 0.6 Å/°K higher and its amplitude decreases much more rapidly with increasing temperature than for the BB peak. This behavior has been explained by a model which takes into account the number of ionized acceptors as a function of temperature.
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