Applied Physics Letters · 1994 · 15 citations · 4 references
EngineeringElectrical EngineeringMaterials ScienceOptoelectronicsPhotonicsSemiconductor DevicesIii-v SemiconductorsLaser DiodesSemiconductor Device MaterialsSemiconductor HeterostructuresSemiconductor LasersSemiconductor PhysicsBeam DivergenceCurrent DensityDifferential EfficiencyHigh-power Laser DiodesHigh-power Semiconductor LasersLaser LinewidthMetalorganic Chemical Vapor DepositionSemiconductor Laser Diodes
High-power operation of 3 W in pulse mode, 750 mW in quasi-continuous wave and 650 mW in continuous wave per uncoated facet from 100-μm aperture has been demonstrated for 1-mm-long cavity InGaAsP/GaAs 808-nm laser diodes prepared by low-pressure metalorganic chemical vapor deposition. Threshold current density of 300 A/cm2, differential efficiency of 1.1 W/A, T0=155 °C, transverse beam divergence of 27°, and less than 2-nm linewidth at 808 nm have been measured. No degradation has been observed after 1000 h of operation in a quasi-continuous wave regime.
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Well-barrier hole burning in quantum well lasers
W. Rideout, W. F. Sharfin, Emil S. Köteles et al. · IEEE Photonics Technology Letters · 1991 · 206 citations
High-power 0.8 mu m InGaAsP-GaAs SCH SQW lasers
D. Z. Garbuzov, N.Y. Antonishkis, A. D. Bondarev et al. · IEEE Journal of Quantum Electronics · 1991 · 155 citations